Electron microscope with silicon valence electron configuration

Electron microscopy is an emerging area in nanotechnology, where researchers are using the same high-speed scanning technique to scan small, nanoscale structures for nanomachines.

In this article, we describe the first silicon valance electron configuration for the scanning electron microscope.

A key advantage of this configuration is that it has a large, stable, and low-power electric field that is very low in current, which is an advantage over other configurations.